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TTTC's Electronic Broadcasting Service |
25th IEEE European Test Symposium |
CALL FOR PAPERS | |
The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability, security and validation. In 2020, ETS will take place in the Radisson Blu Sky Hotel in Tallinn. The city is known for the picturesque Old Town with its medieval architecture. It is organized by the Tallinn University of Technology (TalTech), which co-sponsors the event jointly with the IEEE Council on Electronic Design Automation (CEDA). In addition to scientific paper submissions, ETS offers a track for informal contributions dedicated to early hot ideas and relevant case studies as well as a PhD forum. A Test Spring School and Fringe Workshops will be organized in conjunction with ETS’20. This year we will celebrate the 25th edition of ETS! You are invited to participate and submit your contributions to ETS’20. The areas of interest include (but are not limited to) the following topics:
ETS’20 will produce Formal Proceedings of scientific papers with ISBN number that will be indexed by the IEEE Xplore Digital Library. Also, an Informal Digest will collect contributions in other categories with an open access on-line archiving option. | |
ETS’20 seeks original, unpublished contributions of the following types:
Detailed submission information and guidelines are posted on the ETS’20 web page. | |
Submission deadline: December 9, 2019 Notification of acceptance: February 13, 2020 Camera-ready manuscript: April 1, 2020 | |
| Additional Information | |
General Chairs Artur Jutman, Testonica Lab artur@testonica.com Jaan Raik, TalTech jaan.raik@taltech.ee Program Chairs Görschwin Fey, TU Hamburg goerschwin.fey@tuhh.de Maksim Jenihhin, TalTech maksim.jenihhin@taltech.ee | |
| Committee | |
General Chairs Artur Jutman (EE), Jaan Raik (EE) General Vice Chairs Georges Gielen (BE), Michele Stucchi (BE) Program Chairs Görschwin Fey (DE), Maksim Jenihhin (EE) Program Vice Chair Ioana Vatajelu (FR) Local and Financial Chair Lembit Jürimägi (EE) Topic Chairs Alberto Bosio (FR), Martin Keim (US), Régis Leveugle (FR), Erik J. Marinissen (BE), Maria Michael (CY), Ilia Polian (DE), Christoph Scholl (DE), Haralampos Stratigopoulos (FR), Ioana Vatajelu (FR), Massimo Violante (IT) Informal Contributions Chairs Stephan Eggersglüß (DE), Mihalis Psarakis (GR), Rene Krenz-Baath (DE) Panel Chairs Paolo Bernardi (IT), Teresa McLaurin (US) Embedded Tutorials Chairs Lorena Anghel (FR), Gildas Leger (ES) Special Sessions Chairs Xinli Gu (US), Bernd Becker (DE) PhD Forum Chairs Liviu Miclea (RO), Ernesto Sanchez (IT) Industrial Relations Chair Hans Manhaeve (BE), Jürgen Schlöffel (DE) Publication Chairs Giorgio Di Natale (FR), Mottaqiallah Taouil (NL) Publicity Chairs Stefano di Carlo (IT), Stefan Holst (JP), Nicola Nicolici (CAN) Web Chair Tarmo Robal (EE) Awards Chairs Jerzy Tyszer (PL), Sybille Hellebrand (DE) McCluskey Doctoral Thesis Award Chairs Alberto Bosio (FR), Alessandro Savino (IT) ETS Fringe Workshops Chairs Erik Larsson (SE), Ilia Polian (DE) Test Spring School Chair Sybille Hellebrand (DE), Haralampos Stratigopoulos (FR) Steering Committee Matteo Sonza-Reorda (IT) – Chair Lorena Anghel (FR), Bernd Becker (DE), Rolf Drechsler (DE), Stephan Eggersglüß (DE), Joan Figueras (ES), Patrick Girard (FR), Said Hamdioui (NL), Pete Harrod (GB), Sybille Hellebrand (DE), Artur Jutman (EE), Hans Manhaeve (BE), Erik Jan Marinissen (BE), Maria Michael (CY), Liviu Miclea (RO), Zebo Peng (SE), Jaan Raik (EE), Michel Renovell (FR), Jochen Rivoir (DE), Mehdi Tahoori (DE), Hans-Joachim Wunderlich (DE), Yervant Zorian (US) | |
For more information, visit us on the web at: http://ets2020.taltech.ee/ | |
The 25th IEEE European Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). | |
IEEE Computer Society-Test Technology Technical Council | ||
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